A Test-driven Methodology for Real-time On-line Temperature Prediction and Power Estimation
Jaeha Kung, Minki Cho, Sudhakar Yalamanchili, and Saibal Mukhopadhyay. “A Test-driven Methodology for Real-time On-line Temperature Prediction and Power Estimation.” 2013 IEEE International Test Conference. September 2013.
Abstract
A methodology is developed for fast, on-line, and real-time estimation of transient variations in temperature and average power of an IC after fabrication and packaging and experimentally demonstrated in a 130nm CMOS test-chip.
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Citation
@inproceedings{itc2013-kung,
author={Jaeha Kung, Minki Cho, Sudhakar Yalamanchili, and Saibal Mukhopadhyay},
booktitle={2013 IEEE International Test Conference},
title={A Test-driven Methodology for Real-time On-line Temperature Prediction and Power Estimation},
year={2013},
month={September},
}
author={Jaeha Kung, Minki Cho, Sudhakar Yalamanchili, and Saibal Mukhopadhyay},
booktitle={2013 IEEE International Test Conference},
title={A Test-driven Methodology for Real-time On-line Temperature Prediction and Power Estimation},
year={2013},
month={September},
}
